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[v8,3/3] Documentation: ABI: testing: rtq6056: Update ABI docs

Message ID 1658242365-27797-4-git-send-email-u0084500@gmail.com
State New
Headers show
Series [v8,1/3] dt-bindings: iio: adc: Add rtq6056 adc support | expand

Commit Message

cy_huang July 19, 2022, 2:52 p.m. UTC 
From: ChiYuan Huang <cy_huang@richtek.com>

Add documentation for the usage of voltage channel integration time.

Signed-off-by: ChiYuan Huang <cy_huang@richtek.com>
---
Since v8
- Update IIO ABI about sampling frequency for power/current/voltage channel.

---
 Documentation/ABI/testing/sysfs-bus-iio | 11 +++++++++++
 1 file changed, 11 insertions(+)
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Patch

diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index d4ccc68..17855f7 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -2030,3 +2030,14 @@  Description:
 		Available range for the forced calibration value, expressed as:
 
 		- a range specified as "[min step max]"
+
+What:		/sys/bus/iio/devices/iio:deviceX/in_voltageX_sampling_frequency
+What:		/sys/bus/iio/devices/iio:deviceX/in_powerY_sampling_frequency
+What:		/sys/bus/iio/devices/iio:deviceX/in_currentZ_sampling_frequency
+KernelVersion:	5.20
+Contact:	linux-iio@vger.kernel.org
+Description:
+		Some devices have separate controls of sampling frequency for
+		individual channels. If multiple channels are enabled in a scan,
+		then the sampling_frequency of the scan may be computed from the
+		per channel sampling frequencies.